Journal of Electronic Imaging
Co-published by IS&T and SPIE
The Journal of Electronic Imaging is co-published by IS&T and SPIE. It was developed in response to the significant activity and projected growth in the field and is an outgrowth of the annual Electronic Imaging Science and Technology Symposium.
The Journal of Electronic Imaging publishes papers in all technology areas that make up the field of electronic imaging and are normally considered in the design, engineering, and applications of electronic imaging systems.
Contributed papers cover the following research areas that apply directly to electronic imaging or focus on applied electronic imaging technology:
- Image acquisition
- Hard copy output
- Image data storage
- Image visualization
- Image data communication
- Image processing
- Electronic imaging applications
In addition to technical papers, the Journal also publishes book reviews and Letters to the Editor.
Individual articles are available via the SPIE Digital Library.
Original manuscripts not previously published and not currently submitted for publication elsewhere may be submitted for peer-review. Submissions are handled through SPIE's submission system. Authors should follow the guidelines below before submitting.
Authors preparing manuscripts for JEI should follow these guidelines:
- Manuscripts must be written in English. Typical papers are 8–12 pages in the final two-column SPIE format.
- All figures and images should be of high quality (minimum 300 dpi for raster graphics).
- References should be numbered consecutively in the order they appear in the text and formatted according to SPIE / JEI style.
- Submissions must be accompanied by a statement that the work has not been published previously and is not under consideration for publication elsewhere.
- Authors must comply with IS&T's publication ethics policy. Plagiarism or undisclosed dual submission is grounds for immediate rejection.
- A completed Transfer of Copyright form is required before final publication. SPIE will provide this upon acceptance.
For submission details, contact the SPIE managing editor at gweerts@spie.org.
JEI relies on voluntary peer review by experts in the field. If you are interested in serving as a reviewer, or if you have been invited to review and have questions, please contact the managing editor at gweerts@spie.org.
Reviewers are expected to:
- Declare any conflicts of interest before accepting a review assignment.
- Treat the manuscript as confidential prior to publication.
- Provide constructive, objective, and detailed feedback within the agreed timeframe (typically 4 weeks).
- Assess originality, scientific quality, clarity, and relevance to JEI's scope.
Institutional subscriptions to JEI are processed through SPIE. Institutions receive online access to all JEI content via the SPIE Digital Library.
For current institutional subscription rates and to set up access, contact subscriptions@imaging.org or SPIE directly at gweerts@spie.org.
IS&T Member Subscriptions
IS&T members receive an online subscription to JIST or JEI with their membership. They may purchase a hardcopy or additional online subscription:
- Add-on hardcopy JEI subscription: $75
- Additional online subscription (to JEI): $75
For access or subscription questions, contact subscriptions@imaging.org.
Individual Non-Member Subscriptions
Non-members may purchase individual subscriptions to JEI through SPIE. Contact subscriptions@imaging.org for current non-member rates and options.
Editor-in-Chief
Zeev Zalevsky, Bar-Ilan University (Israel)
Managing Editor
Gwen Weerts, SPIE (US) — gweerts@spie.org
Senior Editors
- Jenny Benois-Pineau, University of Bordeaux (France)
- Laura Boucheron, New Mexico State University (US)
- Alexander C. Loui, Rochester Institute of Technology (US)
- Stuart Perry, University of Technology Sydney (Australia)
- Gianni Ramponi, University of Trieste (Italy)
Associate Editors
Sos Agaian, College of Staten Island (US) • Moulay Akhloufi, Université de Moncton (Canada) • Sana Alamgeer, Texas State University (US) • Mekides Assefa Abebe, Rochester Institute of Technology (US) • Sebastiano Battiato, University of Catania (Italy) • Yevgeny Beiderman, Holon Institute of Technology (Israel) • Honghua Chen, Nanyang Technological University (Singapore) • Peng Chen, RIKEN Center for Computational Science (Japan) • Ravindranath C. Cherukuri, CHRIST University (India) • Stelvio Cimato, Università degli studi di Milano (Italy) • Peter Corcoran, National University of Ireland Galway (Ireland) • Ethan Fetaya, Bar-Ilan University (Israel) • Iuri Frosio, NVIDIA (US) • Harsh Gaonkar, Google (US) • Qiuping Jiang, Ningbo University (China) • Yi Jin, Beijing Jiaotong University (China) • Igor Jovancevic, University of Montenegro • Rajeev Kumar, Delhi Technological University (India) • Guoyu Lu, Rochester Institute of Technology (US) • Vladimir Lukin, National Aerospace University (Ukraine) • Andy J. Ma, Sun Yat-sen University (China) • Benjamin Milgrom, Jerusalem College of Technology (Israel) • Jean-José Orteu, Université de Toulouse, IMT Mines Albi (France) • Gang Pan, Tianjin University (China) • Flavio Piccoli, Instituto Nazionale di Fisica Nucleare (Italy) • Chuan Qin, University of Shanghai for Science and Technology (China) • Dongwei Ren, Harbin Institute of Technology (China) • Alessandro Rizzi, Univ. degli Studi di Milano (Italy) • Ivano Ruo Berchera, Istituto Nazionale di Ricerca Metrologica (Italy) • Aditya Kumar Sahu, SRM University-AP (India) • Ming Shao, University of Massachusetts, Dartmouth (US) • Rakesh Kumar Singh, IIT BHU (India) • Sophie Triantaphillidou, University of Westminster (UK) • Shiqian Wu, Wuhan University of Science and Technology (China) • Gongping Yang, Shandong University (China) • You Yang, Huazhong University of Science and Technology (China) • Mang Ye, Wuhan University (China) • Chai Tong Yuen, Universiti Tunku Abdul Rahman (Malaysia) • Zhongfei (Mark) Zhang, Binghamton University SUNY (US) • Lei Zhu, Shandong Normal University (China)